000 00364nam a2200133Ia 4500
008 230718s9999||||xx |||||||||||||| ||und||
082 _a621.390 287
100 _aBUSHNELL M L
245 0 _aESSENTIAL OF ELECTRONIC TESTING FOR DIGITAL MEMORY
_bAND MIXED SIGNAL VLSI CIRCUITS
250 _a00
260 _bSPRINGER
_c2000
_aNEWYORK
300 _a690
490 _v1
999 _c52695
_d52695